High Sensitivity DLTS System DLS-1000
Ultra-high sensitivity DLTS system / Bulk defect and interface level measurement device
Supports high-sensitivity measurement of bulk internal defects at a level of 108 cm3 and interface states (DLS-1000). Additionally, it comes standard with a library for easy analysis. 【Features】 ● Capable of high-sensitivity contamination detection (2x108 atoms/cm3). ● Equipped with a wide range of interfaces for cryostats. ● Capable of measurements such as temperature, frequency scans, and C-V characteristics. ● Easily profiles depth direction, distribution of traps, and identification of elements and defects, making it effective for analyzing defects and crystal imperfections. (By comparing measurement results with the list of DLTS signals of contaminants in the library, contaminants can be easily identified.) ● High-sensitivity analog/digital system (measurements are analog, data processing is digital) with a unique system employing lock-in averaging method and user-friendly software. ● Over 100 units delivered worldwide, demonstrating extensive delivery experience.
- Company：日本セミラボ 新横浜本社
- Price：Other
